18º Workshop SEMAT/UM - Caracterização Avançada de Materiais
I - Fundamentals of X-ray photoelectron spectroscopy (XPS)
II- Characterization of core/shell nanoparticle thin films and nano-scaled gradient membranes
Download apresentações:
MBruns XPS & ToF-SIMS Braga 2013.pdf (3519KB)
MBruns XPS Nanoscaled Films Braga 2013.pdf (6488KB)
Data:
2ª-feira, 11 de novembro de 2013
Local:
Anfiteatro do departamento de Física, Campus de Gualtar da Universidade do
Minho
Agenda:
15:00-16:00 >> Princípios Gerais
16:00-17:00 >> Characterization of core/shell nanoparticle thin films and
nano-scaled gradient membranes
Palestrante: Michael Bruns, Karlsruhe Institute of Technology (KIT), Alemanha
X-ray photoelectron spectroscopy (XPS) is a powerful tool to characterize nano-scaled materials with respect tochemical binding states and information on shell and/or film thicknesses. Based on gas sensitive materials to be used in an artificial (electronic) nose this contribution focusses on SnO2/SiO2 core/shell nanoparticles with various shell design and on differently shaped nano-scaled membranes with different Al/Si concentration ratios to finally achieve tailored chemical and geometrical gradients. Within the sampling depth of XPS (5-10 nm) parallel angle resolved XPS provides the in-depth distribution of the (multi)layer constituents in a non-destructive manner. Additional transmission electron microscopy (TEM) and low energy ion scattering (LEIS) were used to achieve a comprehensive characterization. The contribution covers a brief introduction on the precursor based fabrication processes for nano-particle (Karlsruhe Microwave Plasma Process) and gradient membrane synthesis (Ion beam induced deposition).
CV de M. Bruns
Michael Bruns received the Ph.D. in chemistry from the Christian-Albrechts-University, Kiel, Germany, in 1985. In 1986 he joined the Karlsruhe Research Center, now Karlsruhe Institute of Technology (KIT). Michael Bruns is head of the Surface Analysis Group at the Institute for Applied Materials of KIT. He is responsible for surface analysis by means of XPS and ToF-SIMS and in addition for physical vapor deposition techniques. The main research focus during the last decades was on the development of nano-scaled chemical sensitive films for e.g. gas-sensor microarrays used as key elements in electronic noses. Since 2005 M. Bruns research interest is extended on surface analytical characterization of (polymer) modified surfaces for e.g. biological applications and recently of energy storage materials. As both surface analysis methods are technology clusters of the Karlsruhe Nano Micro Facility (KNMF) his expertise covers all surface analysis related questions in materials research.
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Palestra organizada pela Professora Anabela Rolo e SEMAT/UM
Nota: A entrada é livre e não carece de registo.
