CSI – Nano-Observer Atomic
Force Microscope
The Nano-Observer is a low
noise compact sample scanning SPM
It operates both in contact and dynamics modes including:
Contact Mode /Friction (lateral force)
Oscillating mode (tapping), phase
AFM microscope system:
100μm X-Y scanning stage
15μm in Z (± 15%)
Z Motorized and vertical approach (15mm travel)
CCD color camera for Top and Side View
Acoustic isolation chamber
Additional Modules
ResiScope:
The ResiScope is the unique system able to measure Resistance over 10
decades with a high sensitivity and resolution. It can be combined with
several dynamic modes as MFM/EFM or KFM single pass providing several
sample characterizations on the same scan area.
Electrical Current/Resistance measurements in the range from 10² to 1012
ohm
Current control and high sensitivity over the full range.
In addition to standard KFM, the Nano-Observer can offer High Definition
KFM mode to highly enhance the resolution and increase the sensitivity
of the surface potential.One pass - NO LIFT
Very high sensitivity
PFM (Piezo Force Mode):
Piezoelectric domains
mapping
Measuring amplitude and
phase signals for fragile samples