CSI – Nano-Observer Atomic Force Microscope

The Nano-Observer is a low noise compact sample scanning SPM

It operates both in contact and dynamics modes including:

Contact Mode /Friction (lateral force)

Oscillating mode (tapping), phase

 

AFM microscope system:

100μm X-Y scanning stage

15μm in Z (± 15%)

Z Motorized and vertical approach (15mm travel)

CCD color camera for Top and Side View

Acoustic isolation chamber

 

Additional Modules

ResiScope:

The ResiScope is the unique system able to measure Resistance over 10 decades with a high sensitivity and resolution. It can be combined with several dynamic modes as MFM/EFM or KFM single pass providing several sample characterizations on the same scan area.

Electrical Current/Resistance measurements in the range from 10² to 10¹² ohm

Current control and high sensitivity over the full range.

Kelvin Probe HD-KFM:

In addition to standard KFM, the Nano-Observer can offer High Definition KFM mode to highly enhance the resolution and increase the sensitivity of the surface potential.One pass - NO LIFT

Very high sensitivity

Higher spatial resolution 

With the Nano-Observer it is possible to perform simultaneously measurements of ResiScope and HD-KFM.

 

PFM (Piezo Force Mode):

Piezoelectric domains mapping

Measuring amplitude and phase signals for fragile samples

Intermittent mode + electrical AC modulation

 

 

 

Atomic Force Microscope