SEMAT-Ing

High angles diffraction system and high-resolution reflectometry

Type of analysis:

High resolution conventional X-ray diffraction of bulk, powder or thin film samples;
Phase analysis;
Environmental diffractometry, from -190 ºC to 1200 ºC;
Grazing Incidence (GIXD):
Residual stresses evaluation (sin2ψ);
Reflectometry

Technical Specifications:

X-ray generator maximum power: 3 kW;
X-ray generator voltage: 20-60 kV, adjustable in steps of 1 kV;
X-ray generator current: 10-60 mA, adjustable in steps of 1 mA;
Goniometer configuration: Theta/2Theta or Theta/Theta;
Goniometer angular step (Theta/2Theta): 0.0001º;
Angular range: - 110º to 168º;
Cupper X-ray tube (anode) with long fine focus (high resolution);
High gain Göbel type X-ray mirror for the incident beam, with a minimum length of 40 mm and divergence of below 0.03º;
A computer controlled absorber for attenuation coefficients up to 1:10,000, and 1:1 for cupper radiation;
“Knife edge” colimator for reflectometry;
Set of micro-slits: 0.3, 0.5, 1, 1.2 and 2 mm diameter and 1 mm diagonal;
Nickel filter for Cu-K_β radiation;
Soller slits for paralell beam with angular resolution between 0.2 e 0.3º;
Dynamic scintillation detector with a maximum count rate of 2 x 10⁶ cps;
Ultra-fast linear detector for X-ray diffraction (LynxEye);
Eulerian Cradle with motorized Chi (tilt) and Phi (rotation) rotations and X-Y-Z translations;
Non environmental chamber for temperature dependent x-ray diffraction possible from -190°C to 1200°C;
Goniometer interface software package, data processing, complete phase identification analysis, Rietveld quantification, texture analysis, residual stresses calculation, reflectometry profiles adjustment (composite materials, thin films and multilayers);
Analytical interface compatible with ICDD/JCPDS database.

Equipment funded through the National Scientific Re-equipment Program of the Foundation for Science and Technology and co-financed by POCI 2010 (FEDER source)
Project REEQ/516/CTM/2005