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SEMAT/UM Equipment |
|
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NanoSEM - FEI Nova 200 (FEG/SEM);
EDAX - Pegasus X4M (EDS/EBSD) |
|
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X-Ray diffraction (XRD) - Bruker D8
Discover |
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Atomic Force Microscope |
 | 3D Optical Profiler |
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Nano/micro indentation – Micro Materials |
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Scratch tester – CSM Instruments |
 |
Laboratory for Sample Preparation |
